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AFM Probes
Registered customers can order
AFM probes, tips and cantilevers
online
.
Other products are not available for online ordering.
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Premounted AFM Probes
FILTER:
-manufacturer-
BudgetSensors
NANOSENSORS
NanoWorld
-any coating-
Electrically Conductive
Magnetic
Reflex Aluminum
Reflex Chromium/Gold
- any tip shape-
High-Aspect-Ratio
Pyramid
Rotated
Standard
Supersharp
new only
• reset
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Order Code
Description
Specs:
Q-EFM
Premounted Electrical, Tapping Mode AFM Probe, for Quesant/Ambios AFM systems
Coating:
Electrically Conductive
Tip Shape:
Rotated
Cantilever:
length: 125 µm
force const.: 40 N/m
res. freq.: 300 kHz
Q-WM190
Premounted Tapping Mode AFM Probe with Long Cantilever, for Quesant/Ambios AFM systems
Coating:
Reflex Aluminum
Tip Shape:
Standard
Cantilever:
length: 225 µm
force const.: 48 N/m
res. freq.: 190 kHz
Q-WM300
Premounted Standard Tapping Mode AFM Probe, for Quesant/Ambios AFM systems
Coating:
Reflex Aluminum
Tip Shape:
Rotated
Cantilever:
length: 125 µm
force const.: 40 N/m
res. freq.: 300 kHz
Q-WM190-SSS
Premounted, SuperSharp Tapping Mode AFM Probe with Long Cantilever, for Quesant/Ambios AFM systems
Coating:
Reflex Aluminum
Tip Shape:
Supersharp
Cantilever:
length: 225 µm
force const.: 48 N/m
res. freq.: 190 kHz
Q-AR5
Premounted High-Aspect-Ratio, Tapping Mode AFM Probe with Long Cantilever, for Quesant/Ambios AFM systems
Coating:
Reflex Aluminum
Tip Shape:
High-Aspect-Ratio
Cantilever:
length: 225 µm
force const.: 48 N/m
res. freq.: 190 kHz
Q-CONT
Premounted Standard Contact Mode AFM Probe, for Quesant/Ambios AFM systems
Coating:
Reflex Aluminum
Tip Shape:
Rotated
Cantilever:
length: 450 µm
force const.: 0.2 N/m
res. freq.: 13 kHz
Q-WM150
Premounted Standard Soft Tapping Mode AFM Probe, for Quesant/Ambios AFM Systems
Coating:
Reflex Aluminum
Tip Shape:
Cantilever:
length: 125 µm
force const.: 5 N/m
res. freq.: 150 kHz
Q-WM75
Premounted Standard Force Modulation AFM Probe, for Quesant/Ambios AFM Systems
Coating:
Reflex Aluminum
Tip Shape:
Cantilever:
length: 225 µm
force const.: 3 N/m
res. freq.: 75 kHz
Q-SiNi
Premounted Silicon Nitride AFM Probe, for Quesant/Ambios AFM systems
Coating:
Reflex Chromium/Gold
Tip Shape:
Pyramid
Cantilever 1:
length: 100 µm
force const.: 0.27 N/m
res. freq.: 30 kHz
Cantilever 2:
length: 200 µm
force const.: 0.06 N/m
res. freq.: 10 kHz
Q-Cond-E
Premounted Electrical, Contact Mode AFM Probe, for Quesant/Ambios AFM systems
Coating:
Electrically Conductive
Tip Shape:
Rotated
Cantilever:
length: 450 µm
force const.: 0.2 N/m
res. freq.: 13 kHz
Q-MFM
Premounted Hard Magnetic, Medium Momentum AFM Probe, for Quesant/Ambios AFM systems
Coating:
Magnetic
Tip Shape:
Rotated
Cantilever:
length: 225 µm
force const.: 3 N/m
res. freq.: 75 kHz
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