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AFM Probes:
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Registered customers can order AFM probes, tips and cantilevers online. Other products are not available for online ordering.
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AFM Probes for Electrical Force / Conductive (EFM, SCM, Tuna, SSR)
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    Order Code Description Specs:
    movePPP-NCHPtPPP-NCHPt
    		Electrical, Tapping Mode AFM Probe
    • Coating:
      Electrically Conductive
    • Tip Shape:
      Standard
    • Cantilever:
      length: 125 µm
      force const.: 42 N/m
      res. freq.: 330 kHz

    movePPP-NCLPtPPP-NCLPt
    		Electrical, Tapping Mode AFM Probe with a Long Cantilever
    • Coating:
      Electrically Conductive
    • Tip Shape:
      Standard
    • Cantilever:
      length: 225 µm
      force const.: 48 N/m
      res. freq.: 190 kHz

    movePPP-NCSTPtPPP-NCSTPt
    		Electrical, Soft Tapping Mode AFM Probe
    • Coating:
      Electrically Conductive
    • Tip Shape:
      Standard
    • Cantilever:
      length: 150 µm
      force const.: 7.4 N/m
      res. freq.: 160 kHz

    movePPP-EFMPPP-EFM
    		Electrical, Force Modulation AFM Probe
    • Coating:
      Electrically Conductive
    • Tip Shape:
      Standard
    • Cantilever:
      length: 225 µm
      force const.: 2.8 N/m
      res. freq.: 75 kHz

    movePPP-CONTPtPPP-CONTPt
    		Electrical, Contact Mode AFM Probe
    • Coating:
      Electrically Conductive
    • Tip Shape:
      Standard
    • Cantilever:
      length: 450 µm
      force const.: 0.2 N/m
      res. freq.: 13 kHz

    movePPP-CONTSCPtPPP-CONTSCPt
    		Electrical, Contact Mode AFM Probe with Short Cantilever
    • Coating:
      Electrically Conductive
    • Tip Shape:
      Standard
    • Cantilever:
      length: 225 µm
      force const.: 0.2 N/m
      res. freq.: 23 kHz

    moveATEC-NCPtATEC-NCPt
    		Electrical, Tapping Mode AFM Probe with a REAL Visible Tip
    • Coating:
      Electrically Conductive
    • Tip Shape:
      Visible
    • Cantilever:
      length: 160 µm
      force const.: 45 N/m
      res. freq.: 335 kHz

    moveATEC-EFMATEC-EFM
    		Electrical, Force Modulation AFM Probe with a REAL Visible Tip
    • Coating:
      Electrically Conductive
    • Tip Shape:
      Visible
    • Cantilever:
      length: 240 µm
      force const.: 2.8 N/m
      res. freq.: 85 kHz

    moveATEC-CONTPtATEC-CONTPt
    		Electrical, Contact Mode AFM Probe with a REAL Visible Tip
    • Coating:
      Electrically Conductive
    • Tip Shape:
      Visible
    • Cantilever:
      length: 450 µm
      force const.: 0.2 N/m
      res. freq.: 15 kHz

    moveARROW-NCPtARROW-NCPt
    		Electrical, Tapping Mode AFM Probe with Tip at the Very End of the Cantilever
    • Coating:
      Electrically Conductive
    • Tip Shape:
      Arrow
    • Cantilever:
      length: 160 µm
      force const.: 42 N/m
      res. freq.: 285 kHz

    moveARROW-EFMARROW-EFM
    		Electrical, Force Modulation AFM Probe with Tip at the Very End of the Cantilever
    • Coating:
      Electrically Conductive
    • Tip Shape:
      Arrow
    • Cantilever:
      length: 240 µm
      force const.: 2.8 N/m
      res. freq.: 75 kHz

    moveNCHPtNCHPt
    		Electrical, Tapping Mode AFM Probe
    • Coating:
      Electrically Conductive
    • Tip Shape:
      Standard
    • Cantilever:
      length: 125 µm
      force const.: 42 N/m
      res. freq.: 320 kHz

    moveEFMEFM
    		Electrical, Force Modulation AFM Probe
    • Coating:
      Electrically Conductive
    • Tip Shape:
      Standard
    • Cantilever:
      length: 225 µm
      force const.: 2.8 N/m
      res. freq.: 75 kHz

    moveSCM-PITSCM-PIT
    		Electrical, Force Modulation AFM Probe
    • Coating:
      Electrically Conductive
    • Tip Shape:
      Standard
    • Cantilever:
      length: 225 µm
      force const.: 2.8 N/m
      res. freq.: 75 kHz

    moveARROW-CONTPtARROW-CONTPt
    		Electrical, Contact Mode AFM Probe with Tip at the Very End of the Cantilever
    • Coating:
      Electrically Conductive
    • Tip Shape:
      Arrow
    • Cantilever:
      length: 450 µm
      force const.: 0.2 N/m
      res. freq.: 14 kHz

    moveCONTPtCONTPt
    		Electrical, Contact Mode AFM Probe
    • Coating:
      Electrically Conductive
    • Tip Shape:
      Standard
    • Cantilever:
      length: 450 µm
      force const.: 0.2 N/m
      res. freq.: 13 kHz

    moveSCM-PICSCM-PIC
    		Electrical, Contact Mode AFM Probe
    • Coating:
      Electrically Conductive
    • Tip Shape:
      Standard
    • Cantilever:
      length: 450 µm
      force const.: 0.2 N/m
      res. freq.: 13 kHz

    moveElectriTap300ElectriTap300
    		Electrical, Tapping Mode AFM Probe
    • Coating:
      Electrically Conductive
    • Tip Shape:
      Rotated
    • Cantilever:
      length: 125 µm
      force const.: 40 N/m
      res. freq.: 300 kHz

    moveElectriTap190-GElectriTap190-G
    		Electrical, Tapping Mode AFM Probe with a Long Cantilever
    • Coating:
      Electrically Conductive
    • Tip Shape:
      Rotated
    • Cantilever:
      length: 225 µm
      force const.: 48 N/m
      res. freq.: 190 kHz

    moveElectriMulti75ElectriMulti75
    		Electrical, Force Modulation AFM Probe
    • Coating:
      Electrically Conductive
    • Tip Shape:
      Rotated
    • Cantilever:
      length: 225 µm
      force const.: 3 N/m
      res. freq.: 75 kHz

    moveElectriMulti75-GElectriMulti75-G
    		Electrical, Force Modulation AFM Probe
    • Coating:
      Electrically Conductive
    • Tip Shape:
      Rotated
    • Cantilever:
      length: 225 µm
      force const.: 3 N/m
      res. freq.: 75 kHz

    moveElectriCont-GElectriCont-G
    		Electrical, Contact Mode AFM Probe
    • Coating:
      Electrically Conductive
    • Tip Shape:
      Rotated
    • Cantilever:
      length: 450 µm
      force const.: 0.2 N/m
      res. freq.: 13 kHz

    moveCDTP-NCHRCDTP-NCHR
    		Diamond Coated, Conductive Tapping Mode AFM Probe
    • Coating:
      Conductive Diamond
    • Tip Shape:
      Standard
    • Cantilever:
      length: 125 µm
      force const.: 42 N/m
      res. freq.: 330 kHz

    moveCDT-NCHRCDT-NCHR
    		Diamond Coated, Conductive Tapping Mode AFM Probe
    • Coating:
      Conductive Diamond
    • Tip Shape:
      Standard
    • Cantilever:
      length: 125 µm
      force const.: 42 N/m
      res. freq.: 330 kHz

    moveCDT-NCLRCDT-NCLR
    		Diamond Coated, Conductive Tapping Mode AFM Probe with Long Cantilever
    • Coating:
      Conductive Diamond
    • Tip Shape:
      Standard
    • Cantilever:
      length: 225 µm
      force const.: 48 N/m
      res. freq.: 190 kHz

    moveCDT-FMRCDT-FMR
    		Diamond Coated, Conductive Force Modulation AFM Probe
    • Coating:
      Conductive Diamond
    • Tip Shape:
      Standard
    • Cantilever:
      length: 225 µm
      force const.: 2.8 N/m
      res. freq.: 75 kHz

    moveCDT-CONTRCDT-CONTR
    		Diamond Coated, Conductive Contact Mode AFM Probe
    • Coating:
      Conductive Diamond
    • Tip Shape:
      Standard
    • Cantilever:
      length: 450 µm
      force const.: 0.2 N/m
      res. freq.: 13 kHz

    moveNW-CDT-NCHRNW-CDT-NCHR
    		Diamond Coated, Conductive Tapping Mode AFM Probe
    • Coating:
      Conductive Diamond
    • Tip Shape:
      Standard
    • Cantilever:
      length: 125 µm
      force const.: 42 N/m
      res. freq.: 320 kHz

    moveDDESPDDESP
    		Diamond Coated, Conductive Tapping Mode AFM Probe
    • Coating:
      Conductive Diamond
    • Tip Shape:
      Standard
    • Cantilever:
      length: 125 µm
      force const.: 42 N/m
      res. freq.: 320 kHz

    moveNW-CDT-NCLRNW-CDT-NCLR
    		Diamond Coated, Conductive Tapping Mode AFM Probe with Long Cantilever
    • Coating:
      Conductive Diamond
    • Tip Shape:
      Standard
    • Cantilever:
      length: 225 µm
      force const.: 48 N/m
      res. freq.: 190 kHz

    moveNW-CDT-FMRNW-CDT-FMR
    		Diamond Coated, Conductive Force Modulation AFM Probe
    • Coating:
      Conductive Diamond
    • Tip Shape:
      Standard
    • Cantilever:
      length: 225 µm
      force const.: 2.8 N/m
      res. freq.: 75 kHz

    moveDDESP-FMDDESP-FM
    		Diamond Coated, Conductive Force Modulation AFM Probe
    • Coating:
      Conductive Diamond
    • Tip Shape:
      Standard
    • Cantilever:
      length: 225 µm
      force const.: 2.8 N/m
      res. freq.: 75 kHz

    movePPP-NCHAuPPP-NCHAu
    		Gold Coated Tapping Mode AFM Probe
    • Coating:
      Gold Overall
    • Tip Shape:
      Standard
    • Cantilever:
      length: 125 µm
      force const.: 42 N/m
      res. freq.: 330 kHz

    movePPP-NCLAuPPP-NCLAu
    		Gold Coated Tapping Mode AFM Probe with Long Cantilever
    • Coating:
      Gold Overall
    • Tip Shape:
      Standard
    • Cantilever:
      length: 225 µm
      force const.: 48 N/m
      res. freq.: 190 kHz

    movePPP-NCSTAuPPP-NCSTAu
    		Gold Coated Soft Tapping Mode AFM Probe
    • Coating:
      Gold Overall
    • Tip Shape:
      Standard
    • Cantilever:
      length: 150 µm
      force const.: 7.4 N/m
      res. freq.: 160 kHz

    movePPP-FMAuPPP-FMAu
    		Gold Coated Force Modulation AFM Probe
    • Coating:
      Gold Overall
    • Tip Shape:
      Standard
    • Cantilever:
      length: 225 µm
      force const.: 2.8 N/m
      res. freq.: 75 kHz

    movePPP-CONTAuPPP-CONTAu
    		Gold Coated Contact Mode AFM Probe
    • Coating:
      Gold Overall
    • Tip Shape:
      Standard
    • Cantilever:
      length: 450 µm
      force const.: 0.2 N/m
      res. freq.: 13 kHz

    movePPP-CONTSCAuPPP-CONTSCAu
    		Gold Coated Contact Mode AFM Probe with Short Cantilever
    • Coating:
      Gold Overall
    • Tip Shape:
      Standard
    • Cantilever:
      length: 225 µm
      force const.: 0.2 N/m
      res. freq.: 23 kHz

    moveATEC-NCAuATEC-NCAu
    		Gold Coated Tapping Mode AFM Probe with a REAL Visible Tip
    • Coating:
      Gold Overall
    • Tip Shape:
      Visible
    • Cantilever:
      length: 160 µm
      force const.: 45 N/m
      res. freq.: 335 kHz

    moveATEC-FMAuATEC-FMAu
    		Gold Coated Force Modulation AFM Probe with a REAL Visible Tip
    • Coating:
      Gold Overall
    • Tip Shape:
      Visible
    • Cantilever:
      length: 240 µm
      force const.: 2.8 N/m
      res. freq.: 85 kHz

    moveATEC-CONTAuATEC-CONTAu
    		Gold Coated Contact Mode AFM Probe with a REAL Visible Tip
    • Coating:
      Gold Overall
    • Tip Shape:
      Visible
    • Cantilever:
      length: 450 µm
      force const.: 0.2 N/m
      res. freq.: 15 kHz

    moveTap300GBTap300GB
    		Gold Coated Tapping Mode AFM Probe
    • Coating:
      Gold Overall
    • Tip Shape:
      Rotated
    • Cantilever:
      length: 125 µm
      force const.: 40 N/m
      res. freq.: 300 kHz

    moveMulti75GB-GMulti75GB-G
    		Gold Coated Force Modulation AFM Probe
    • Coating:
      Gold Overall
    • Tip Shape:
      Rotated
    • Cantilever:
      length: 225 µm
      force const.: 3 N/m
      res. freq.: 75 kHz

    moveContGB-GContGB-G
    		Gold Coated Contact Mode AFM Probe
    • Coating:
      Gold Overall
    • Tip Shape:
      Rotated
    • Cantilever:
      length: 450 µm
      force const.: 0.2 N/m
      res. freq.: 13 kHz

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