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 ARROW-CONTR
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Contact Mode AFM Probe with Tip at the Very End of the Cantilever
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- Coating:
Reflex Aluminum
- Tip Shape:
Arrow
- Cantilever:
length: 450 µm force const.: 0.2 N/m res. freq.: 14 kHz
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 ARROW-CONT
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Contact Mode AFM Probe with Tip at the Very End of the Cantilever
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- Coating:
None
- Tip Shape:
Arrow
- Cantilever:
length: 450 µm force const.: 0.2 N/m res. freq.: 14 kHz
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 ESP
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Standard Contact Mode AFM Probe
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- Coating:
Reflex Aluminum
- Tip Shape:
Standard
- Cantilever:
length: 450 µm force const.: 0.2 N/m res. freq.: 13 kHz
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 CONTSC
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Contact Mode AFM Probe with Short Cantilever
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- Coating:
None
- Tip Shape:
Standard
- Cantilever:
length: 225 µm force const.: 0.2 N/m res. freq.: 23 kHz
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 CONTSCR
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Contact Mode AFM Probe with Short Cantilever
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- Coating:
Reflex Aluminum
- Tip Shape:
Standard
- Cantilever:
length: 225 µm force const.: 0.2 N/m res. freq.: 23 kHz
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 ATEC-CONT
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Contact Mode AFM Probe with a REAL Visible Tip
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- Coating:
None
- Tip Shape:
Visible
- Cantilever:
length: 450 µm force const.: 0.2 N/m res. freq.: 15 kHz
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 Contact
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Standard Contact Mode AFM Probe
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- Coating:
None
- Tip Shape:
Rotated
- Cantilever:
length: 450 µm force const.: 0.2 N/m res. freq.: 13 kHz
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 ContAl-G
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Standard Contact Mode AFM Probe
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- Coating:
Reflex Aluminum
- Tip Shape:
Rotated
- Cantilever:
length: 450 µm force const.: 0.2 N/m res. freq.: 13 kHz
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 All-In-One
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AFM probe with 4 different cantilevers for various applications
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- Coating:
None
- Tip Shape:
Rotated
- Cantilever 1:
length: 210 µm force const.: 2.7 N/m res. freq.: 80 kHz
Cantilever 2: length: 500 µm force const.: 0.2 N/m res. freq.: 15 kHz
Cantilever 3: length: 100 µm force const.: 40 N/m res. freq.: 350 kHz
Cantilever 4: length: 150 µm force const.: 7.4 N/m res. freq.: 150 kHz
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 All-In-One-Al
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AFM probe with 4 different cantilevers for various applications
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- Coating:
Reflex Aluminum
- Tip Shape:
Rotated
- Cantilever 1:
length: 500 µm force const.: 0.2 N/m res. freq.: 15 kHz
Cantilever 2: length: 100 µm force const.: 40 N/m res. freq.: 350 kHz
Cantilever 3: length: 210 µm force const.: 2.7 N/m res. freq.: 80 kHz
Cantilever 4: length: 150 µm force const.: 7.4 N/m res. freq.: 150 kHz
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 SiNi
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Silicon Nitride AFM Probe
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- Coating:
Reflex Chromium/Gold
- Tip Shape:
Pyramid
- Cantilever 1:
length: 200 µm force const.: 0.06 N/m res. freq.: 10 kHz
Cantilever 2: length: 100 µm force const.: 0.27 N/m res. freq.: 30 kHz
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 PNP-TR
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Silicon Nitride AFM Probe
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- Coating:
Reflex Chromium/Gold
- Tip Shape:
Pyramid
- Cantilever 1:
length: 100 µm force const.: 0.32 N/m res. freq.: 67 kHz
Cantilever 2: length: 200 µm force const.: 0.08 N/m res. freq.: 17 kHz
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 PNP-DB
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Silicon Nitride AFM Probe
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- Coating:
Reflex Chromium/Gold
- Tip Shape:
Pyramid
- Cantilever 1:
length: 100 µm force const.: 0.48 N/m res. freq.: 67 kHz
Cantilever 2: length: 200 µm force const.: 0.06 N/m res. freq.: 17 kHz
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 PPP-CONTSC
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Contact Mode AFM Probe with Short Cantilever
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- Coating:
None
- Tip Shape:
Standard
- Cantilever:
length: 225 µm force const.: 0.2 N/m res. freq.: 23 kHz
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 PPP-CONTSCR
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Contact Mode AFM Probe with Short Cantilever
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- Coating:
Reflex Aluminum
- Tip Shape:
Standard
- Cantilever:
length: 225 µm force const.: 0.2 N/m res. freq.: 23 kHz
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 PPP-CONTAuD
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Gold Coated Contact Mode AFM Probe
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- Coating:
Reflex Gold
- Tip Shape:
Standard
- Cantilever:
length: 450 µm force const.: 0.2 N/m res. freq.: 13 kHz
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 ContGD
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Gold Coated Contact Mode AFM Probe
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- Coating:
Reflex Gold
- Tip Shape:
Rotated
- Cantilever:
length: 450 µm force const.: 0.2 N/m res. freq.: 13 kHz
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 PPP-XYCONTR
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Contact Mode AFM Probe with Special Alignment System
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- Coating:
Reflex Aluminum
- Tip Shape:
Standard
- Cantilever:
length: 450 µm force const.: 0.2 N/m res. freq.: 13 kHz
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 PPP-RT-CONTR
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Standard Contact Mode AFM Probe
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- Coating:
Reflex Aluminum
- Tip Shape:
Rotated
- Cantilever:
length: 450 µm force const.: 0.2 N/m res. freq.: 13 kHz
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 CP-CONT-Au
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Special Contact Mode AFM Probe
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- Coating:
None
- Tip Shape:
Sphere
- Cantilever:
length: 450 µm force const.: 0.2 N/m res. freq.: 13 kHz
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 CP-CONT-BSG
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Special Contact Mode AFM Probe
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- Coating:
None
- Tip Shape:
Sphere
- Cantilever:
length: 450 µm force const.: 0.2 N/m res. freq.: 13 kHz
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 CP-CONT-PM
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Special Contact Mode AFM Probe
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- Coating:
None
- Tip Shape:
Sphere
- Cantilever:
length: 450 µm force const.: 0.2 N/m res. freq.: 13 kHz
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 CP-CONT-PS
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Special Contact Mode AFM Probe
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- Coating:
None
- Tip Shape:
Sphere
- Cantilever:
length: 450 µm force const.: 0.2 N/m res. freq.: 13 kHz
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 CP-CONT-SiO
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Special Contact Mode AFM Probe
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- Coating:
None
- Tip Shape:
Sphere
- Cantilever:
length: 450 µm force const.: 0.2 N/m res. freq.: 13 kHz
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 CP-PNP-Au
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Special Silicon Nitride AFM Probe
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- Coating:
Reflex Chromium/Gold
- Tip Shape:
Sphere
- Cantilever 1:
length: 100 µm force const.: 0.32 N/m res. freq.: 67 kHz
Cantilever 2: length: 200 µm force const.: 0.08 N/m res. freq.: 17 kHz
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 CP-PNP-BSG
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Special Silicon Nitride AFM Probe
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- Coating:
Reflex Chromium/Gold
- Tip Shape:
Sphere
- Cantilever 1:
length: 100 µm force const.: 0.32 N/m res. freq.: 67 kHz
Cantilever 2: length: 200 µm force const.: 0.08 N/m res. freq.: 17 kHz
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 CP-PNP-PM
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Special Silicon Nitride AFM Probe
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- Coating:
Reflex Chromium/Gold
- Tip Shape:
Sphere
- Cantilever 1:
length: 100 µm force const.: 0.32 N/m res. freq.: 67 kHz
Cantilever 2: length: 200 µm force const.: 0.08 N/m res. freq.: 17 kHz
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 CP-PNP-PS
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Special Silicon Nitride AFM Probe
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- Coating:
Reflex Chromium/Gold
- Tip Shape:
Sphere
- Cantilever 1:
length: 100 µm force const.: 0.32 N/m res. freq.: 67 kHz
Cantilever 2: length: 200 µm force const.: 0.08 N/m res. freq.: 17 kHz
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 CP-PNP-SiO
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Special Silicon Nitride AFM Probe
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- Coating:
Reflex Chromium/Gold
- Tip Shape:
Sphere
- Cantilever 1:
length: 100 µm force const.: 0.32 N/m res. freq.: 67 kHz
Cantilever 2: length: 200 µm force const.: 0.08 N/m res. freq.: 17 kHz
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